Publication
Reliable design methodology: the combined effect of radiation, variability and temperature
About the publication
Year
2016
Authors
García-Redondo, F; López-Vallejo, M.L..; Aparicio, H., & Ituero, P.
Journal
2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lisbon, Portugal, pp. 1-4
Research Areas
Technologies