Characterization of Analog Modules: Reliability Analyses of Radiation, Temperature and Variations Effects

Year 2016

Title Characterization of Analog Modules: Reliability Analyses of Radiation, Temperature and Variations Effects

Authors Fernando Garcia Redondo ,Hernan Aparicio Cerqueira ,M. Luisa Lopez Vallejo ,Pablo Ituero Herrero ,Carlos Alberto Lopez Barrio

2016 CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS 2016)

Strategic Areas Remote Sensing & Space

Technologies Electronics and Systems

DOI https://doi.org/